Meet the world experts on nanoscale imaging and characterization
Registration for the ISPM 2009 Conference will be open on Tuesday 16th from 3 pm to 8 pm, and on Wednesday 17th from 7.30 am to 7 pm. |
The International Scanning Probe Microscopy Conference is the 11th meeting in a continuing series of international meetings featuring research on scanning probe microscopy, cantilever-based sensors and SPM-based nanolithography and manipulation. This year the conference will cover a variety of topics such as Nanomechanics, Force spectroscopy, Novel instrumentation, Tip-based nanofabrication, Nanoscale quantitative analysis and High resolution imaging in air and liquids. The conference covers the following topics: Nanomechanics Force spectroscopy Novel instrumentation Biomolecular imaging Tip-based nanofabrication Nanoscale quantitative analysis High resolution imaging: air and liquids
|